Tag Archives: Mobile

Quickly Noted: EETimes on the challenges of testing semiconductor memory for mobile applications. Is testing really a 3D IC “stopper”?

Posted on February 8, 2012 by sleibson2

Janine Love at EETimes interviewed Cecil Ho, President of CST (Simmtester.com)—a memory tester vendor, about issues surrounding the testing of semiconductor memory that’s optimized for and aimed at mobile applications. In these applications board real estate and physical volume are … Continue reading →

Posted in 3D, DRAM, Flash, MCP | Tagged , , , | 1 Comment

JEDEC Mobile Memory Summit: The pace quickens and memory standards must keep up

Posted on January 25, 2012 by sleibson2

By Scott Jacobson CES hosted the JEDEC Mobile Memory Summit on January 12th to review the current state of the market for mobile semiconductor memory and to discuss future trends.  It was a full day review of current mobile device … Continue reading →

Posted in DRAM, eMMC, Flash, JEDEC, NAND, UFS | Tagged , , , , , , , | Leave a comment